Database
Information
Inspec Connect to Inspec
Access: Internet-delivered database. There are three ways to connect:
   1. from a public computer in the University of Delaware Library
   2. from a University of Delaware campus connection in your dorm, lab, or office
   3. from an off-campus connection (University of Delaware ID required)
Description: Inspec, one of the databases available in Engineering Village, is the leading bibliographic database concentrating on electrical and electronic engineering, physics, information technology, and computer and control systems.
Coverage: 1969-
Updated: weekly
Journals: A List of Journal Titles Covered by INSPEC is available.
Links: Links to electronic full text are available for many publishers’ journals through the CrossRef service. Click on “Abstract/Links” or “Detailed Record/Links” following a citation on a results list. If full text is available, there will be an orange “Full-text” icon above the detailed record. Has GetIt! links.
Alerts: Register for a personal account at the left of the initial screen. Then click on “My Alerts” at the top of the screen to manage your e-mail alerts.
Personalization: Register for a personal account at the left of the initial screen. Then click on “My Profile” at the top of the screen to view/update saved searches, view/update alerts, view/update folders, and edit/remove account.
Output Formats: Use the Results Manager at the bottom of the page to save, print or e-mail results.
Help: Click on the “Help” tab in the upper right of the screen. For further assistance, contact a librarian.
Related Resources:

Databases for Computer and Information Sciences
Databases for Electrical and Computer Engineering
Databases for Physics and Astronomy

Corresponds to three print publications: Computer & Control Abstracts (Library Annex QA76 .C548), Electrical & Electronics Abstracts (Library Annex TK145 .E38), and Physics Abstracts (Library Annex QC1 .P46).

Users: 6 concurrent users
Producer: Engineering Information Inc.

This page is maintained by Erin Daix, Collection Development Department.

Last modified: 07/25/11